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1

Hillock growth on aluminum and aluminum alloy films

S. Aceto, C.Y. Chang, R.W. Vook

Journal:

Thin Solid Films

Year:

1992

Language:

english

File:

PDF, 583 KB

english, 1992

2

Wear debris analysis in rotating Ag-Cu electrical contacts

A. Banerjee, J.G. Zhang, M. Garshasb, L.R. Zhang, R.W. Vook

Journal:

Year:

1983

Language:

english

File:

PDF, 1.20 MB

english, 1983

3

Hydrogen trapping and re-emission in TiB2 coatings for tokamaks upon thermal, pulsed electron and laser annealing

B.L. Doyle, F.L. Vook

Journal:

Journal of Nuclear Materials

Year:

1979

Language:

english

File:

PDF, 470 KB

english, 1979

4

Initial epitaxial growth of (111) Au/(111) Cu and (111) Cu/(111) Au

J.E. Macur, R.W. Vook

Journal:

Thin Solid Films

Year:

1980

Language:

english

File:

PDF, 536 KB

english, 1980

5

A contact potential difference study of the epitaxialgrowth of aluminum on Pd(111) films

A. Domenicucci, R.W. Vook

Journal:

Thin Solid Films

Year:

1990

Language:

english

File:

PDF, 822 KB

english, 1990

6

Characterization of Ag Wire Brush/Cu Slip Ring Electrical Contacts Rotating in Wet CO2

Vook, R., Ji-Gao Zhang, Banerjee, A., Garshasb, M., Zhang, L.

Journal:

IEEE Transactions on Components Hybrids and Manufacturing Technology

Year:

1983

Language:

english

File:

PDF, 1.01 MB

english, 1983

7

Enhanced sulfur segregation in plastically deformed OFHC Cu and the effect of surface segregated sulfur on electric contact resistance

Kothari, R., Vook, R.W.

Journal:

IEEE Transactions on Components Packaging and Manufacturing Technology Part A

Year:

1994

Language:

english

File:

PDF, 772 KB

english, 1994

8

[IEEE 2014 IEEE/MTT-S International Microwave Symposium - MTT 2014 - Tampa, FL, USA (2014.6.1-2014.6.6)] 2014 IEEE MTT-S International Microwave Symposium (IMS2014) - MIMO and beamforming solutions for 5G technology

Vook, Frederick W., Ghosh, Amitava, Thomas, Timothy A.

Year:

2014

Language:

english

File:

PDF, 996 KB

english, 2014

9

Report to the American Physical Society by the study group on physics problems relating to energy technologies: Radiation effects on materials

Vook, F. L., Birnbaum, H. K., Blewitt, T. H., Brown, W. L., Corbett, J. W., Crawford, J. H., Goland, A. N., Kulcinski, G. L., Robinson, M. T., Seidman, D. N., Young, F. W., Bardeen, J., Balluffi, R. W

Journal:

Review of Modern Physics

Year:

1975

Language:

english

File:

PDF, 3.32 MB

english, 1975

10

Nucleation And Growth Of Thin Films

Vook, Richard W.

Journal:

Optical Engineering

Year:

1984

Language:

english

File:

PDF, 11.91 MB

english, 1984

11

[IEEE 2018 IEEE 5G World Forum (5GWF) - Silicon Valley, CA (2018.7.9-2018.7.11)] 2018 IEEE 5G World Forum (5GWF) - Evaluation of Tomlinson-Harashima Precoding for 5G Massive MU-MIMO

Begashaw, Simon, Shao, Xuning, Visotsky, Eugene, Vook, Fred, Ghosh, Amitava

Year:

2018

Language:

english

File:

PDF, 284 KB

english, 2018

12

Ion beam studies of H and He in metals

S.T. Picraux, F.L. Vook

Journal:

Journal of Nuclear Materials

Year:

1974

Language:

english

File:

PDF, 522 KB

english, 1974

13

Depth distribution profiling of deuterium and 3He

R.A Langley, S.T Picraux, F.L Vook

Journal:

Journal of Nuclear Materials

Year:

1974

Language:

english

File:

PDF, 385 KB

english, 1974

14

Cu films formed simultaneously on (111) and (100) NaCl

R.W. Vook, C.T. Horng

Journal:

Thin Solid Films

Year:

1973

Language:

english

File:

PDF, 1.92 MB

english, 1973

15

Microstructural characterization of epitaxial Au/Cu bicrystals

R.W. Vook, J.E. Macur

Journal:

Thin Solid Films

Year:

1976

Language:

english

File:

PDF, 615 KB

english, 1976

16

The characteristics of epitaxial overgrowths of cuprous sulfide formed on copper films investigated by reflection high energy electron diffraction

O.J. Cain, R.W. Vook

Journal:

Thin Solid Films

Year:

1978

Language:

english

File:

PDF, 4.43 MB

english, 1978

17

Hydrogen retention and release in first-wall coatings for tokamaks

B.L. Doyle, F.L. Vook

Journal:

Thin Solid Films

Year:

1979

Language:

english

File:

PDF, 255 KB

english, 1979

18

The annealing of misfit dislocations in the (111) Cu/(111) Cu2O system

R.W. Vook, J.H. Ho

Journal:

Thin Solid Films

Year:

1979

Language:

english

File:

PDF, 477 KB

english, 1979

19

Misfit dislocations in (001) Cu/(111) Ag epitaxial bilayers

R.W. Vook, S.S. Chao

Journal:

Thin Solid Films

Year:

1979

Language:

english

File:

PDF, 347 KB

english, 1979

20

The structure of epitaxial overgrowths of Cu2S formed on (111) Cu

O.J. Cain, R.W. Vook

Journal:

Thin Solid Films

Year:

1979

Language:

english

File:

PDF, 253 KB

english, 1979

21

Characterization of epitaxial thin films by reflection high energy electron diffraction, transmission electron microscopy and Auger electron spectroscopy

Journal:

Thin Solid Films

Year:

1982

Language:

english

File:

PDF, 76 KB

english, 1982

22

Adsorption of O2 and CO on thin films of palladium

V.D. Vankar, R.W. Vook, B.C. De Cooman

Journal:

Thin Solid Films

Year:

1983

Language:

english

File:

PDF, 1.07 MB

english, 1983

23

A highly efficient source for vapor deposition of platinum

Pankaj Dixit, R.W. Vook

Journal:

Thin Solid Films

Year:

1983

Language:

english

File:

PDF, 169 KB

english, 1983

24

Kikuchi rings from polycrystalline platinum films with a 〈111〉 fiber axis

Pankaj Dixit, R.W. Vook

Journal:

Thin Solid Films

Year:

1984

Language:

english

File:

PDF, 445 KB

english, 1984

25

A work function study of the initial epitaxial growth and stability of thin copper layers on Pd(111)

R.W. Vook, J.V. Bucci, S.S. Chao

Journal:

Thin Solid Films

Year:

1988

Language:

english

File:

PDF, 318 KB

english, 1988

26

Isothermal annealing of hillocks in AlCu films

C.Y Chang, R.W Vook, Y.C Lee, I Hoshi

Journal:

Thin Solid Films

Year:

1989

Language:

english

File:

PDF, 716 KB

english, 1989

27

Electromigration-resistant Cu-Pd alloy films

C.W. Park, R.W. Vook

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 3.20 MB

english, 1993

28

Formation and growth of electromigration induced islands in aluminum and in aluminum alloy films

C.Y. Chang, R.W. Vook

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 3.24 MB

english, 1993

29

Characterization of copper slip ring-wire brush electrical contacts

B Singh, BH Hwang, RW Vook

Journal:

Year:

1982

Language:

english

File:

PDF, 1.90 MB

english, 1982

30

Surface segregation from gold alloys

Peter A. Dowben, Allen H. Miller, Richard W. Vook

Journal:

Year:

1987

Language:

english

File:

PDF, 7.68 MB

english, 1987

31

Epitaxy of NaCl on muscovite

F.A. Koch, R.W. Vook

Journal:

Thin Solid Films

Year:

1972

Language:

english

File:

PDF, 2.26 MB

english, 1972

32

Ag films formed simultaneously on (111) and (100) NaCl

R.W. Vook, C.H. Chung

Journal:

Thin Solid Films

Year:

1976

Language:

english

File:

PDF, 2.99 MB

english, 1976

33

Epitaxy and misfit dislocations in large misfit systems

Journal:

Thin Solid Films

Year:

1979

Language:

english

File:

PDF, 1.78 MB

english, 1979

34

Interdiffusion phenomena in Au/Cu and Cu/Au bilayers

J.E. Macur, R.W. Vook

Journal:

Thin Solid Films

Year:

1980

Language:

english

File:

PDF, 848 KB

english, 1980

35

Auger analysis of thick silver films and of silver layers grown on copper

Y. Namba, R.W. Vook

Journal:

Thin Solid Films

Year:

1981

Language:

english

File:

PDF, 1.30 MB

english, 1981

36

The effect of surface aluminum oxide films on thermally induced hillock formation

C.Y. Chang, R.W. Vook

Journal:

Thin Solid Films

Year:

1993

Language:

english

File:

PDF, 4.54 MB

english, 1993

37

In-situ ultra-high vacuum studies of electromigration in copper films

B.H. Jo, R.W. Vook

Journal:

Thin Solid Films

Year:

1995

Language:

english

File:

PDF, 560 KB

english, 1995

38

Electrical control of surface electromigration damage

Journal:

Thin Solid Films

Year:

1997

Language:

english

File:

PDF, 604 KB

english, 1997

39

Transmission and reflection electron microscopy of electromigration phenomena

Journal:

Materials Chemistry and Physics

Year:

1994

Language:

english

File:

PDF, 3.93 MB

english, 1994

40

Bandwidth performance of linear adaptive arrays with tapped delay-line processing

Vook, F.W., Compton, R.T., Jr.

Journal:

IEEE Transactions on Aerospace and Electronic Systems

Year:

1992

Language:

english

File:

PDF, 752 KB

english, 1992

41

[IEEE MILCOM 2010 - 2010 IEEE Military Communications Conference - San Jose, CA, USA (2010.10.31-2010.11.3)] 2010 - MILCOM 2010 MILITARY COMMUNICATIONS CONFERENCE - Error-resistant differential feedback of long-term covariance matrix in closed-loop MIMO

Thomas, Timothy A., Mondal, Bishwarup, Visotsky, Eugene, Vook, Frederick W.

Year:

2010

Language:

english

File:

PDF, 136 KB

english, 2010

42

Kinematic theory of the effect of surface relaxation on X-ray diffraction peak shifts

Ralph T.S. Shiah, R.W. Vook

Journal:

Surface Science

Year:

1973

Language:

english

File:

PDF, 836 KB

english, 1973

43

Correction to "exploiting CMOS reverse interconnect scaling in multigigahertz amplifier and oscillator design"

Kleveland, B., Diaz, C.H., Vook, D., Madden, L., Lee, T.H., Wong, S.S.

Journal:

IEEE Journal of Solid-State Circuits

Year:

2002

Language:

english

File:

PDF, 5 KB

english, 2002

44

[IEEE GLOBECOM 2002 - IEEE Global Communications Conference - Taipei, Taiwan (17-21 Nov. 2002)] Global Telecommunications Conference, 2002. GLOBECOM '02. IEEE - OFDM multi-antenna designs with concatenated codes

Xiangyang Zhuang,, Vook, F.W., Thomas, T.A.

Year:

2002

Language:

english

File:

PDF, 417 KB

english, 2002

45

MOS C-V characterization of ultrathin gate oxide thickness (1.3-1.8 nm)

Chang-Hoon Choi,, Jung-Suk Goo,, Tae-Young Oh,, Zhiping Yu,, Dutton, R.W., Bayoumi, A., Min Cao,, Voorde, P.V., Vook, D., Diaz, C.H.

Journal:

IEEE Electron Device Letters

Year:

1999

Language:

english

File:

PDF, 78 KB

english, 1999

46

[IEEE 2007 IEEE 66th Vehicular Technology Conference - Baltimore, MD, USA (2007.09.30-2007.10.3)] 2007 IEEE 66th Vehicular Technology Conference - Finite Impulse Response Cyclic Shift Transmit Diversity for Broadband Mobile OFDM

Hillery, William J., Krauss, Thomas P., Mondal, Bishwarup, Thomas, Timothy A., Vook, Frederick W.

Year:

2007

Language:

english

File:

PDF, 243 KB

english, 2007

47

[IEEE 2007 IEEE 65th Vehicular Technology Conference - Dublin, Ireland (2007.04.22-2007.04.25)] 2007 IEEE 65th Vehicular Technology Conference - VTC2007-Spring - Methods for Switching Between Long Term and Short Term Transmit Beamforming in OFDM

Thomas, Timothy A., Mondal, Bishwarup, Vook, Frederick W.

Year:

2007

Language:

english

File:

PDF, 216 KB

english, 2007

48

[IEEE IEEE Vehicular Technology Conference - Hyatt Regency Montreal, Montreal, QC, Canada (2006.09.25-2006.09.28)] IEEE Vehicular Technology Conference - Channel Estimation for Per-Subcarrier Maximal Ratio Transmission in OFDM

Thomas, Timothy, Zhuang, Xiangyang, Vook, Frederick

Year:

2006

Language:

english

File:

PDF, 125 KB

english, 2006

49

Structure of hydrogen center in D-implanted Si

Picraux, S. T., Vook, F. L.

Journal:

Physical Review B

Year:

1978

Language:

english

File:

PDF, 752 KB

english, 1978

50

Applications of Ion Beams to Metals || Blistering of Niobium Due to Low Energy Helium Ion Bombardment Investigated by Rutherford Backscattering

Picraux, S. T., EerNisse, E. P., Vook, F. L.

Year:

1974

Language:

english

File:

PDF, 1.25 MB

english, 1974

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